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THORLABS BP209-VIS/M Dual Scanning Slit Beam Profiler (200-1100 nm, Metric)

Key Specifications (a)

Wavelength Range: 200 - 1100 nm

Detector Material: UV-Enhanced Si

Aperture Diameter: 9 mm

Scan Methods: Scanning Slits, Knife Edge

Slit Sizes: 5 µm and 25 µm

Beam Diameter Range: 2.5 µm - 9 mm

(a) Imperial and metric Item #s differ only in the threading of the tapped holes in the baseplate.

Details

MANUAL:



  • Quality Engagement
  • Easy change and return
  • Delivery Avaliable
  • Favorable payment

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